Production firmware never used SYNC_METHOD_EZSYNC — both callsites
(main.cpp:938 recovery, main.cpp:1955 boot) pass SYNC_METHOD_TIMED.
The original audit C-14 flagged TX/RX SPI skew in EZSync's trigger
sequence, but the path was dead from production; only test_bug3
referenced it for spy-harness regression coverage.
Removed:
- SYNC_METHOD_EZSYNC enum value
- ADF4382A_SetupEZSync function (and declaration)
- ADF4382A_TriggerEZSync function (and declaration)
- EZSync branch in ADF4382A_Manager_Init (collapsed to unconditional
SetupTimedSync call)
- test_bug3_timed_sync_noop.c Test C (EZSync regression coverage)
Production header and test shim header both cleaned. SyncMethod enum
kept as single-value to avoid touching the 7 other test callers that
pass SYNC_METHOD_TIMED.
Residual concern (separate from original C-14): ADF4382A_TriggerTimedSync
uses the same TX-then-RX sw_sync SPI sequencing pattern as the deleted
EZSync trigger. ~5 µs SPI gap between TX-armed and RX-armed means TX
and RX may capture different SYNCP/SYNCN edges (60 MHz cycle = 16.7 ns,
~300 edges in the gap). External SYNCP only provides simultaneity if
both devices are armed before a common edge. Hardware bench-test
required to confirm operational tolerance; cannot fix in firmware
without DMA SPI burst rewrite.
Regression: 86/0 (matches baseline).
Implements the STM32 outer-loop AGC (ADAR1000_AGC) that reads the FPGA
saturation flag on DIG_5/PD13 once per radar frame and adjusts the
ADAR1000 VGA common gain across all 16 RX channels.
Phase 4 — ADAR1000_AGC class (new files):
- ADAR1000_AGC.h/.cpp: attack/recovery/holdoff logic, per-channel
calibration offsets, effectiveGain() with OOB safety
- test_agc_outer_loop.cpp: 13 tests covering saturation, holdoff,
recovery, clamping, calibration, SPI spy, reset, mixed sequences
Phase 5 — main.cpp integration:
- Added #include and global outerAgc instance
- AGC update+applyGain call between runRadarPulseSequence() and
HAL_IWDG_Refresh() in main loop
Build system & shim fixes:
- Makefile: added CXX/CXXFLAGS, C++ object rules, TESTS_WITH_CXX in
ALL_TESTS (21 total tests)
- stm32_hal_mock.h: const uint8_t* for HAL_UART_Transmit (C++ compat),
__NOP() macro for host builds
- shims/main.h + real main.h: FPGA_DIG5_SAT pin defines
All tests passing: MCU 21/21, GUI 92/92, cross-layer 29/29.
Bug #11: platform_noos_stm32.c used HAL_SPI_Transmit instead of
HAL_SPI_TransmitReceive — reads returned garbage. Changed to in-place
full-duplex. Dead code (never called), fixed per audit recommendation.
Test added: test_bug11_platform_spi_transmit_only.c. Mock infrastructure
updated with SPI spy types. All 11 firmware tests pass.
FPGA B2: Migrated long_chirp_lut[0:3599] from ~700 lines of hardcoded
assignments to BRAM with (* ram_style = "block" *) attribute and
$readmemh("long_chirp_lut.mem"). Added sync-only read block for proper
BRAM inference. 1-cycle read latency introduced. short_chirp_lut left
as distributed RAM (60 entries, too small for BRAM).
FPGA B3: Added BREG (window_val_reg) and MREG (mult_i_raw/mult_q_raw)
pipeline stages to doppler_processor.v. Eliminates DPIP-1 and DPOP-2
DRC warnings. S_LOAD_FFT retimed: fft_input_valid starts at sub=2,
+1 cycle total latency. BREG primed in S_PRE_READ at no extra cost.
Both FPGA files compile clean with Icarus Verilog.
Bug #9: Both TX and RX SPI init params had platform_ops = NULL, causing
adf4382_init() -> no_os_spi_init() to fail with -EINVAL. Fixed by setting
platform_ops = &stm32_spi_ops and passing stm32_spi_extra with correct CS
port/pin for each device.
Bug #10: stm32_spi_write_and_read() never toggled chip select. Since TX
and RX ADF4382A share SPI4, every register write hit both PLLs. Rewrote
stm32_spi.c to assert CS LOW before transfer and deassert HIGH after,
using stm32_spi_extra metadata. Backward-compatible: legacy callers
(e.g., AD9523) with cs_port=NULL skip CS management.
Also widened chip_select from uint8_t to uint16_t in no_os_spi.h since
STM32 GPIO_PIN_xx values (e.g., GPIO_PIN_14=0x4000) overflow uint8_t.
10/10 tests pass (8 original + 2 new regression tests).